A microprocessor-based dynamic inductance/capacitance meter

Author

Rizkalla, Maher E. ; Gundrum, Harry C. ; Kara, Miklos T.

Author_Institution

Dept. of Electr. Eng., Purdue Univ., Indianapolis, IN, USA

fYear

1992

Firstpage

140

Abstract

A microprocessor-based dynamic inductance/capacitance meter has been developed. Two different approaches are examined utilizing the frequency response of the circuit where the unknown reactive element is included. One procedure uses an LC oscillator which generates a frequency that is proportional to the reactive elements, while the other employs the resonance response of an RLC circuit from which the unknown element can be determined by the phase relationship. An 8088 processor detects the frequency counts in the first procedure, monitors the phase relationship in the second, and performs the required calculations for both. The microprocessor periodically samples the output of the LC oscillator at its input port to dynamically monitor the changes in the reactive circuit elements. Within 5% error over the frequency range of 100 Hz to 256 kHz, a wide range of inductance and capacitance values for both approaches were determined

Keywords

automatic test equipment; capacitance measurement; digital instrumentation; inductance measurement; 100 Hz to 256 kHz; 8088 processor; LC oscillator; RLC circuit; dynamic inductance/capacitance meter; frequency response; microprocessor-based; phase relationship; resonance response; Capacitance; Counting circuits; Frequency measurement; Inductance; Magnetic field measurement; Magnetic materials; Microprocessors; Oscillators; RLC circuits; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on

Conference_Location

Washington, DC

Print_ISBN

0-7803-0510-8

Type

conf

DOI

10.1109/MWSCAS.1992.271312

Filename

271312