Title :
Manufacturing... A New Science... And The IC Design Engineer
Author_Institution :
IBM Research Center, Yorktown Heights, NY
Keywords :
Circuit testing; Computer aided manufacturing; Computer integrated manufacturing; Design automation; Design engineering; Integrated circuit yield; Manufacturing automation; Manufacturing processes; Redundancy; Virtual manufacturing;
Conference_Titel :
Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1988.663608
