• DocumentCode
    1621386
  • Title

    Testing and reliability

  • fYear
    2010
  • Firstpage
    469
  • Lastpage
    470
  • Abstract
    Start of the above-titled section of the conference proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed Design of Integrated Circuits and Systems (MIXDES), 2010 Proceedings of the 17th International Conference
  • Conference_Location
    Warsaw
  • Print_ISBN
    978-1-4244-7011-2
  • Type

    conf

  • Filename
    5551677
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1621386