مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1621386

Title :

Testing and reliability

fYear :

2010

Firstpage :

469

Lastpage :

470

Abstract :

Start of the above-titled section of the conference proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Mixed Design of Integrated Circuits and Systems (MIXDES), 2010 Proceedings of the 17th International Conference

Conference_Location :

Warsaw

Print_ISBN :

978-1-4244-7011-2

Type :

conf

Filename :

5551677

Link To Document :