Title :
Memory performance in chip-on-chip packages: Optimizing memory/ASIC integration
Author :
O´Connor, Kevin J. ; Low, Yee L. ; Gregus, Jeffrey A. ; Degani, Yinon
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Abstract :
Chip-on-chip MCM packaging combines the benefits of conventional MCM methods with conventional ASIC/commercial memory printed circuit board design methods. COC can reduce board space, increase performance, maintain a cost competitive position and offer an alternative to embedded SRAM and DRAM in the appropriate situations. We show that additional testing for known-good-die is minimal, functional to parametric memory yield is very high, COC module assembly is simple and straightforward, and final packaging is essentially identical to conventional ASIC packaging processes
Keywords :
DRAM chips; EPROM; SRAM chips; application specific integrated circuits; circuit optimisation; integrated circuit design; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; microassembling; multichip modules; ASIC design methods; ASIC packaging processes; COC module assembly; EPROM; MCM methods; board space; chip-on-chip MCM packaging; chip-on-chip packages; cost competitiveness; embedded DRAM; embedded SRAM; functional-to-parametric memory yield; known-good-die testing; memory performance; memory printed circuit board design methods; memory/ASIC integration optimization; Application specific integrated circuits; Assembly; Bonding; Costs; EPROM; Packaging; Random access memory; Space technology; Testing; Very large scale integration;
Conference_Titel :
IC/Package Design Integration, 1998. Proceedings. 1998 IEEE Symposium on
Conference_Location :
Santa Cruz, CA
Print_ISBN :
0-8186-8433-X
DOI :
10.1109/IPDI.1998.663614