• DocumentCode
    1621484
  • Title

    RF Driven Plasmas in Semiconductor Manufacturing

  • Author

    Forster, John C.

  • Author_Institution
    Appl. Mater., Santa Clara
  • fYear
    2007
  • Firstpage
    463
  • Lastpage
    463
  • Abstract
    Summary form only given. This talk will give a biased overview of the application of RF driven plasmas to semiconductor manufacturing. The advances in understanding plasma physics in such applications has occurred through the collaboration of many disciplines: plasma modeling/simulation, plasma diagnostics, basic plasma physics, and RF engineering. The evolution of sources will be discussed, from straight capacitively coupled plasmas, to inductively coupled plasmas, to the latest development of dual frequency capacitively coupled plasmas. Even some contributions from the often overlooked field of DC plasmas will be discussed. Some case studies from these fields will be discussed in depth. Many plasma physicists enjoy their studies due to the richness of plasma phenomena. However, semiconductor manufacturing applications rely on making the plasmas as "boring" as possible: plasma uniformity over the workpiece, and repeatabilitv are key. It will be shown that even in these "boring" plasmas, it is possible to uncover interesting phenomena.
  • Keywords
    plasma diagnostics; plasma materials processing; plasma radiofrequency heating; plasma simulation; plasma sources; semiconductor technology; DC plasmas; RF driven plasmas; RF engineering; basic plasma physics; dual frequency capacitively coupled plasmas; inductively coupled plasmas; plasma diagnostics; plasma modeling; plasma simulation; plasma sources; plasma uniformity; semiconductor manufacturing applications; straight capacitively coupled plasmas; Artificial intelligence; Physics; Plasma applications; Plasma diagnostics; Plasma materials processing; Plasma simulation; Plasma sources; Radio frequency; Semiconductor device manufacture; Semiconductor materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
  • Conference_Location
    Albuquerque, NM
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-0915-0
  • Type

    conf

  • DOI
    10.1109/PPPS.2007.4345769
  • Filename
    4345769