Title :
The effect of noise in dynamic testing of A/D converters
Author :
Pei, Shiyan ; Khouzam, Nash
Author_Institution :
Nat. Semiconductor Corp., Santa Clara, CA, USA
Abstract :
The concept of adding noise to the signal source to improve the accuracy and repeatability of the measurements of analog to digital (A/D) converters is introduced. The theoretical background and practical implementation issues are presented. The use of random noise to smooth the edges of quantization noise is discussed, and the relationship of total harmonic distortion to transfer junction is examined
Keywords :
analogue-digital conversion; dynamic testing; random noise; A/D converters; accuracy; dynamic testing; noise; quantization noise; random noise; repeatability; signal source; total harmonic distortion; transfer junction; Data acquisition; Distortion measurement; Harmonic distortion; Noise measurement; Noise shaping; Quantization; Semiconductor device noise; Signal to noise ratio; Testing; Transfer functions;
Conference_Titel :
Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0510-8
DOI :
10.1109/MWSCAS.1992.271334
