DocumentCode :
1622123
Title :
Fault location using impedance-based algorithms on non-homogeneous feeders
Author :
Kulkarni, S. ; Karnik, N. ; Das, S. ; Santoso, S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
fYear :
2011
Firstpage :
1
Lastpage :
6
Abstract :
Impedance-based algorithms like the positive-sequence reactance and Takagi methods are derived assuming a homogenous line conductor. This assumption is violated in practical distribution feeder circuits. The objective of this paper is to demonstrate that these methods can still be effectively applied to non-homogenous feeders by using the line parameters of the most commonly occurring conductor type in the circuit. This approach is first tested on a modified IEEE Test Feeder by simulating two cases, namely, the reference case and the case with a homogenous feeder. For the positive-sequence reactance method the maximum absolute error in both cases is about 8%, while for the Takagi method it is 6.92% and 9.53% in the homogenous case and reference case, respectively. The proposed approach is then demonstrated using ten fault cases on utility distribution feeders. The average absolute error obtained for the positive-sequence reactance and Takagi estimates is 10.23% and 9.34%, respectively, which corresponds to a median error value of 0.16 miles and 0.15 miles in the location estimates.
Keywords :
fault location; overhead line conductors; power distribution faults; power distribution lines; power distribution protection; Takagi methods; distribution feeder circuits; fault location; homogenous line conductor; impedance-based algorithms; modified IEEE test feeder; nonhomogeneous feeders; positive-sequence reactance method; power distribution fault; utility distribution feeders; Circuit faults; Conductors; Estimation error; Fault location; Monitoring; Relays; Substations; Diagnosis (fault); power distribution faults; power system monitoring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power and Energy Society General Meeting, 2011 IEEE
Conference_Location :
San Diego, CA
ISSN :
1944-9925
Print_ISBN :
978-1-4577-1000-1
Electronic_ISBN :
1944-9925
Type :
conf
DOI :
10.1109/PES.2011.6039257
Filename :
6039257
Link To Document :
بازگشت