Title :
Test generation of analog switched-current circuits
Author :
Wang, Cheng-Ping ; Wey, Chin-Long
Author_Institution :
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
Based on possible defects on the layout of a practical non-ideal switch, fault model and test generation of current copiers, basic building block of switched-current circuits, are presented in this study. We consider two types of switches, current switches and voltage switches, which have been commonly used in both switched-current circuits and switched-capacitor circuits, and both catastrophic and non-catastrophic faults of transistors used as switches. The generated test sequence achieve full testability of current copiers. The tester and test process are readily applied for any switched-current circuits
Keywords :
CMOS analogue integrated circuits; analogue processing circuits; automatic testing; built-in self test; circuit analysis computing; current conveyors; design for testability; field effect transistor switches; integrated circuit modelling; integrated circuit testing; switched current circuits; BIST design; CMOS switch; analog switched-current circuits; catastrophic faults; circuit simulation; current copiers; current switches; fault model; full testability; macromodel; noncatastrophic faults; stray inductance; switched-capacitor circuits; test sequence generation; transistor switches; voltage switches; Analog circuits; Analog-digital conversion; CMOS technology; Circuit faults; Circuit testing; Digital circuits; Signal processing; Switches; Switching circuits; Voltage;
Conference_Titel :
Test Symposium, 1996., Proceedings of the Fifth Asian
Conference_Location :
Hsinchu
Print_ISBN :
0-8186-7478-4
DOI :
10.1109/ATS.1996.555171
