Test generation of analog switched-current circuits

Author

Wang, Cheng-Ping ; Wey, Chin-Long

Author_Institution

Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA

fYear

1996

Firstpage

276

Lastpage

281

Abstract

Based on possible defects on the layout of a practical non-ideal switch, fault model and test generation of current copiers, basic building block of switched-current circuits, are presented in this study. We consider two types of switches, current switches and voltage switches, which have been commonly used in both switched-current circuits and switched-capacitor circuits, and both catastrophic and non-catastrophic faults of transistors used as switches. The generated test sequence achieve full testability of current copiers. The tester and test process are readily applied for any switched-current circuits

Keywords

CMOS analogue integrated circuits; analogue processing circuits; automatic testing; built-in self test; circuit analysis computing; current conveyors; design for testability; field effect transistor switches; integrated circuit modelling; integrated circuit testing; switched current circuits; BIST design; CMOS switch; analog switched-current circuits; catastrophic faults; circuit simulation; current copiers; current switches; fault model; full testability; macromodel; noncatastrophic faults; stray inductance; switched-capacitor circuits; test sequence generation; transistor switches; voltage switches; Analog circuits; Analog-digital conversion; CMOS technology; Circuit faults; Circuit testing; Digital circuits; Signal processing; Switches; Switching circuits; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1996., Proceedings of the Fifth Asian

Conference_Location

Hsinchu

ISSN

1085-7735

Print_ISBN

0-8186-7478-4

Type

conf

DOI

10.1109/ATS.1996.555171

Filename

555171