Title :
A topological method of class-fault diagnosis [of analog circuits]
Author :
Sun, Yichuang ; Fidler, J.K.
Author_Institution :
Dept. of Electron., York Univ., UK
Abstract :
A topological method of class-fault diagnosis of analog circuits is proposed. Certain topological classification theorems and techniques are developed. By using them, one can classify branch sets directly from the circuit configuration before test. A class-fault identification technique is also given which may uniquely determine the fault class after test. The method requires very little computation and no graphical conditions
Keywords :
analogue circuits; circuit analysis computing; failure analysis; network topology; analog circuits; branch sets; class-fault diagnosis; class-fault identification technique; topological classification theorems; topological method; Analog circuits; Circuit faults; Circuit testing; Constitution; Dictionaries; Fault diagnosis; Inspection; Linearity; Nonlinear circuits; Sun;
Conference_Titel :
Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0510-8
DOI :
10.1109/MWSCAS.1992.271356
