Practical test strategies for users of 100 p.p.m. ICs

It is noted that in 1980s, integrated circuit suppliers have made major improvements in their product quality. As a result, users are receiving large volumes of devices with failure rates of less than 100 p.p.m.. This has provided users with alternatives to 100% testing, such as dock-to-stock and just-in-time programs. Although the quality of devices has improved, lots with reject rates exceeding 10000 p.p.m. continue to be reported. The author presents test results that demonstrate that quality variations from suppliers continue to occur. It is concluded that users should consider current results and carefully develop, from the many strategies available, their own strategies for reducing test costs while minimizing the risk of accepting defective devices. A number of test strategies and their applications are outlined