Title :
Steady state aliasing error probability for multi-input linear feedback shift registers
Author :
Seireg, Reda H. ; Vacroux, André G.
Author_Institution :
Mil. Tech. Coll., Cairo, Egypt
Abstract :
The traditional way to calculate the steady state aliasing error probability (SS-AEP) is to calculate a general expression for the AEP with the length of the input pattern equal to n and then limit this expression. Markov state diagrams are used to model the multi-input linear feedback shift register (MISR) for two cases: MISR with primitive polynomials and MISR with nonprimitive polynomials. The SS-AEP is calculated by solving the local balance equations. This new approach is straightforward and easy to handle. In some cases the new results differ from those previously published
Keywords :
built-in self test; error statistics; logic testing; many-valued logics; polynomials; shift registers; MISR; Markov state diagrams; input pattern; local balance equations; multi-input linear feedback shift registers; nonprimitive polynomials; primitive polynomials; steady state aliasing error probability; Data compression; Differential equations; Educational institutions; Error correction; Error probability; Genetic expression; Linear feedback shift registers; Polynomials; Steady-state; Testing;
Conference_Titel :
Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0510-8
DOI :
10.1109/MWSCAS.1992.271382
