DocumentCode :
1622904
Title :
Knowledge verification of machine-learning procedures based on test structure measurements
Author :
Khera, D. ; Linholm, L.W. ; Allen, R.A. ; Cresswell, M.W. ; Tyree, V.C. ; Hansford, W. ; Pina, C.
Author_Institution :
Nat. Inst. of Stand & Technol., Gaithersburg, MD, USA
fYear :
1990
Firstpage :
145
Lastpage :
149
Abstract :
The authors describe an approach for evaluating and refining the rules, based on test structure measurements, to be entered into the knowledge base of an expert system that characterizes device performance. The objective is to qualify the performance of rules determined by a machine-learning classification application with the best knowledge available from the human experts. The technique combines a machine-learning approach with the traditional heuristic-based development of an expert system. Strengths and weaknesses of the individual techniques are compared
Keywords :
automatic testing; electronic engineering computing; expert systems; integrated circuit testing; knowledge engineering; learning systems; device performance characterisation; expert system; heuristic-based development; knowledge base; knowledge verification; machine-learning classification application; machine-learning procedures; microelectronic testing; rule validation; test structure measurements; Computer aided manufacturing; Electronic equipment testing; Expert systems; Frequency; Humans; Inference algorithms; Ring oscillators; Semiconductor device testing; Silicon; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 1991. ICMTS 1991. Proceedings of the 1991 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
0-87942-588-1
Type :
conf
DOI :
10.1109/ICMTS.1990.161729
Filename :
161729
Link To Document :
بازگشت