Title :
Performance Analysis of OFDM Systems with Selected Mapping in the Presence of Nonlinearity
Author :
Kitaek Bae ; Changyong Shin ; Powers, E.
Author_Institution :
Syst. Archit. Lab., Samsung Adv. Inst. of Technol., Yongin, South Korea
Abstract :
In the presence of nonlinearity, we analyze the impact of the selected mapping (SLM) technique on bit-error-rate (BER) performance of orthogonal frequency division multiplexing (OFDM) systems in an additive white Gaussian noise channel. The peak-to-average-ratio (PAR) reduction gain of SLM can be increased by improving the PAR statistics at the cost of complexity in the OFDM transmitter, thereby helping to decrease the required power amplifier (PA) output backoff (OBO). However, since the PAR statistics focus only on the statistical distribution of the highest peak in an OFDM symbol, the statistics cannot be used to quantify BER performance degradation in the presence of nonlinearity such as that caused by a PA or digital-to-analog converter (DAC). We first derive a closed-form expression for the envelope power distribution in an OFDM system with SLM. Then, using this derived envelope power distribution, we investigate the BER performance and the total degradation (TD) of OFDM systems with SLM under the existence of nonlinearity. We discuss peak backoff (PBO) and the clipping ratio, which determine the operating point of the PA and dynamic range of the DAC, respectively. Lastly, we consider the total degradation (TD), which indicates the tradeoff between the OBO and the E_b/N_o penalty due to nonlinearity, and numerically compute the PBO and clipping ratio that minimize the TD. The TD-minimizing PBO and clipping ratio are given as functions of the number of candidate signals in SLM.
Keywords :
OFDM modulation; error statistics; power amplifiers; spatial light modulators; statistical distributions; DAC; Gaussian noise channel; OBO; OFDM symbol; OFDM systems; OFDM transmitter; PA output backoff; PAR reduction gain; PAR statistics; SLM technique; TD-minimizing PBO; bit-error-rate performance; clipping ratio; closed-form expression; digital-to-analog converter; envelope power distribution; orthogonal frequency division multiplexing systems; peak backoff; peak-to-average-ratio; power amplifier; quantify BER performance degradation; selected mapping; statistical distribution; total degradation; OFDM; output backoff (OBO); peak-to-average-ratio (PAR); selected mapping (SLM); total degradation (TD);
Journal_Title :
Wireless Communications, IEEE Transactions on
DOI :
10.1109/TWC.2013.040213.120968