DocumentCode :
1623288
Title :
Estimation method of electromagnetic wave emission from electronic equipment
Author :
Masuda, Koichiro ; Hatakeyama, Ken-ichi ; Koshiji, Kohji ; Shu, Eimei
Author_Institution :
NEC Corp., Kawasaki, Japan
Volume :
1
fYear :
1997
Firstpage :
136
Abstract :
The maximum emission estimation method (MEEM) described here simplifies the procedure for measuring undesired electromagnetic emissions from electronic products and does not require measurements to be made at specified test sites. Although the source distributions of the emissions in actual electronic products are rather complicated, in many cases the main sources of the emissions are considered to be cables, such as power cords and cables connecting peripherals. With MEEM, it is necessary only to measure the maximum value of the current standing waves at each frequency, The field intensities in the far field region are calculated as the maximum possible emission. While MEEM overestimates the emission intensity, the values agree within a few decibels with those measured in a semi-anechoic chamber in the frequency range from 30 to 300 MHz
Keywords :
approximation theory; electric field measurement; electromagnetic wave interference; 30 to 300 MHz; MEEM; current standing waves; electromagnetic emissions; electromagnetic wave emission; electronic equipment; electronic products; field intensities; frequency range; maximum emission estimation; power cords; semi-anechoic chamber; source distributions; Cables; Current measurement; Electromagnetic interference; Electromagnetic measurements; Electromagnetic scattering; Electronic equipment; Frequency measurement; Joining processes; National electric code; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
Conference_Location :
Ottawa, Ont.
ISSN :
1091-5281
Print_ISBN :
0-7803-3747-6
Type :
conf
DOI :
10.1109/IMTC.1997.603930
Filename :
603930
Link To Document :
بازگشت