Title :
Dynamic interactions among multiple FACTS controllers — A survey
Author :
Kim, Hee Jin ; Nam, Taesik ; Hur, Kyeon ; Chang, Byunghoon ; Chow, Joe H. ; Entriken, Robert
Author_Institution :
Yonsei Univ., Seoul, South Korea
Abstract :
Increasing number of Flexible AC Transmission System (FACTS) devices have been be installed to reinforce the existing grid and build the envisioned “Smartness” into the grid through controls and optimization. However, it has been noticed that adverse interactions among multiple FACTS controllers may occur when they are not properly coordinated with each other and other slowly acting system equipment. These interactions can amplify oscillations and even destabilize the system by influencing the damping properties of individual FACTS controllers or increasing voltage deviations. This paper presents an extensive survey on the existing cases, system studies and assessment techniques to help system planners understand the underlying mechanism of diverse interactions among multiple FACTS controllers and develop coordinated control schemes for preventing or mitigating any harmful interactions. Control interactions are categorized and discussed in terms of their root causes and resulting frequency ranges. Unfriendly interactions involving shunt FACTS devices are detailed in which Korean Electric Power Corporation (KEPCO) is particularly interested.
Keywords :
flexible AC transmission systems; power transmission control; power transmission planning; Korean Electric Power Corporation; coordinated control schemes; damping properties; dynamic interactions; flexible AC transmission system devices; multiple FACTS controllers; shunt FACTS devices; system planners; voltage deviations; Eigenvalues and eigenfunctions; Frequency control; Oscillators; Power capacitors; Power system stability; Static VAr compensators; Thyristors; Control interaction; FACTS controllers; Flexible AC Transmission system (FACTS); Oscillation; Static Var Compensator (SVC);
Conference_Titel :
Power and Energy Society General Meeting, 2011 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4577-1000-1
Electronic_ISBN :
1944-9925
DOI :
10.1109/PES.2011.6039300