DocumentCode :
1623360
Title :
Results of the Self Magnetic Pinch X-ray Source Experiments On The RITS-6 High Impedance MITL
Author :
Portillo, S. ; Oliver, B.V. ; Cordova, S. ; Brunner, N. ; Ziska, D.
Author_Institution :
Sandia Nat. Labs. Albuquerque, Albuquerque
fYear :
2007
Firstpage :
540
Lastpage :
540
Abstract :
Summary form only given. As part of a collaborative effort into investigating pulsed power driven high brightness X-ray sources Sandia National Laboratories has conducted a series of experimental runs with the Self Magnetic Pinched (SMP) diode on the RITS-6 accelerator. The annular electron beam of the SPM X-ray source is capable of pinching tightly to pencil size spot size with a large forward directed radiation dose. Coupling of power flow as well as interactions of the electron beam with plasmas from ionized gases of the anode can greatly influence the radiation dose and spot size. Cathode diameter, geometry, and AK gap are key factors in optimizing the operation of the SMP diode. Time integrated spot sizes under 3 mm and forward directed dose in excess of 200 rads at 1 meter were observed. Voltage calculations from radiographers equations are also given which are consistent with PIC simulations. PSF derived from the Barnea square aperture method. Measurements of the time varying behavior of the spot size as well as movement from center will also be presented.
Keywords :
beam handling techniques; cathodes; electron beams; pinch effect; plasma X-ray sources; plasma interactions; AK gap; Barnea square aperture method; RITS-6 accelerator; SMP diode; SPM X-ray source; Sandia National Laboratories; annular electron beam; cathode diameter; cathode geometry; electron beam-plasma interaction; forward directed radiation dose; high brightness X-ray sources; high impedance MITL; point spread function; pulsed power driven X-ray sources; self magnetic pinch X-ray source; spot size time varying behavior; Accelerator magnets; Brightness; Collaboration; Diodes; Electron beams; Impedance; Ion accelerators; Laboratories; Optical coupling; Scanning probe microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
Conference_Location :
Albuquerque, NM
ISSN :
0730-9244
Print_ISBN :
978-1-4244-0915-0
Type :
conf
DOI :
10.1109/PPPS.2007.4345846
Filename :
4345846
Link To Document :
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