Title :
An architecture-based comparison of verification and statistical reliability assessment methods for embedded software systems
Author :
Bastani, Farokh B. ; Kim, Sung ; I-Ling Yen ; Ing-Ray Chen
Author_Institution :
Dept. of Comput. Sci., Texas Univ., Richardson, TX, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
Embedded computer systems are used to automate critical real-time applications, including process control systems, manufacturing systems, transportation systems, etc. In order to certify these critical systems, it is necessary to be able to rigorously demonstrate that high quality has been achieved. One approach is to decompose the software into more manageable aspects that can be independently certified. The software architecture is then used to certify the overall system. We compare the efficacy of formal verification and statistical reliability assessment methods for certifying the system based on the certification of the independent aspects and the system architecture
Keywords :
certification; distributed processing; embedded systems; program verification; software architecture; software quality; software reliability; certification; critical real-time applications; embedded software systems; formal verification; manufacturing systems; process control systems; software architecture; statistical reliability assessment methods; transportation systems; Application software; Certification; Computer aided manufacturing; Embedded computing; Formal verification; Manufacturing systems; Process control; Real time systems; Software architecture; Transportation;
Conference_Titel :
Object-Oriented Real-Time Distributed Computing, 2002. (ISORC 2002). Proceedings. Fifth IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7695-1558-4
DOI :
10.1109/ISORC.2002.1003691