Title :
Automatic test generation from communicating extended finite state machine (CEFSM)-based models
Author :
Li, J. Jenny ; Wong, W. Eric
Author_Institution :
Avaya Res. Labs., Basking Ridge, NJ, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
We present a methodology based on communicating extended finite state machines (CEFSM) to generate tests automatically from system specifications. Unlike other model-based methods, it does not require the creation of any new models. Rather, it uses the existing available system models including both data and behavioral information. Our CEFSM-based test generation uses FSMs (finite state machines) to model behavior and events, their extension with variables to model data, and their interaction channels to model communication. Our method generates tests based on a combination of behavior, data, and communication specifications. Another important difference is that our method addresses branching coverage not only for data-related decision coverage, but also behavioral transition coverage. Sophisticated "priority" and "dominator" analysis is applied to generate efficient test cases to increase, as much as possible with as few tests as possible, the branching coverage of the system being tested
Keywords :
finite state machines; formal specification; program testing; specification languages; SDL; automatic test generation; behavioral information; behavioral transition coverage; branching coverage; communicating extended finite state machines; data-related decision coverage; interaction channels; methodology; model-based methods; software testing; system specifications; Automata; Automatic testing;
Conference_Titel :
Object-Oriented Real-Time Distributed Computing, 2002. (ISORC 2002). Proceedings. Fifth IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7695-1558-4
DOI :
10.1109/ISORC.2002.1003693