Title :
Practical built-in test of CMOS state machines with realistic faults
Author :
Katoozi, Mehdi ; Soma, Mani
Author_Institution :
Seattle Silicon Corp., Bellevue, WA, USA
Abstract :
A design-for-test scheme is presented that is capable of testing programmable and register logic arrays with the same low-cost test hardware. This scheme detects real faults resulting from mask defects in the circuit, is practical to implement, and can be adopted as a built-in-test system using readily available modules in application-specific integrated circuits
Keywords :
CMOS integrated circuits; application specific integrated circuits; automatic testing; logic arrays; logic testing; CMOS state machines; application-specific integrated circuits; built-in test; logic arrays; low-cost test hardware; mask defects; readily available modules; realistic faults; Built-in self-test; CMOS logic circuits; Circuit testing; Design for testability; Electrical fault detection; Hardware; Logic design; Logic testing; Programmable logic arrays; Registers;
Conference_Titel :
Circuits and Systems, 1989., IEEE International Symposium on
Conference_Location :
Portland, OR
DOI :
10.1109/ISCAS.1989.100371
