DocumentCode
1623964
Title
A 9.4-μm2 38-GHz sidewall polycide base bipolar (SPOTEC) with half-micron CMOS technology for very-high-speed ULSIs
Author
Shiba, Takeo ; Tamaki, Yoichi ; Onai, Takahiro ; Saitoh, Masayoshi ; Kure, Tokuo ; Nakamura, Tohru
Author_Institution
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
fYear
1993
Firstpage
67
Lastpage
70
Abstract
The BiCMOS technology described combines very small high-speed Si bipolar transistors and half-micron CMOS FETs. The bipolar transistors are fabricated with self-aligned sidewall polycide base technology (SPOTEC), which makes it possible to reduce their area below that of CMOS FETs. Their footprint can be as small as 9.4 μm2. Shallow junction technologies improve bipolar performance, and a maximum cut-off frequency of 38 GHz is achieved with good bipolar and CMOS I-V characteristics. The driving ability of these BiCMOS circuits is twice as that of CMOS circuits
Keywords
BiCMOS integrated circuits; 38 GHz; BiCMOS circuits; I-V characteristics; SPOTEC; Si bipolar transistors; Si-SiO2; Si-WSix; elemental semiconductor; half-micron CMOS FETs; maximum cut-off frequency; self-aligned sidewall polycide base technology; small high-speed; very-high-speed ULSIs; BiCMOS integrated circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar/BiCOMS Circuits and Technology Meeting, 1993., Proceedings of the 1993
Conference_Location
Minneapolis, MN
Print_ISBN
0-7803-1316-X
Type
conf
DOI
10.1109/BIPOL.1993.617471
Filename
617471
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