• DocumentCode
    1623964
  • Title

    A 9.4-μm2 38-GHz sidewall polycide base bipolar (SPOTEC) with half-micron CMOS technology for very-high-speed ULSIs

  • Author

    Shiba, Takeo ; Tamaki, Yoichi ; Onai, Takahiro ; Saitoh, Masayoshi ; Kure, Tokuo ; Nakamura, Tohru

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • fYear
    1993
  • Firstpage
    67
  • Lastpage
    70
  • Abstract
    The BiCMOS technology described combines very small high-speed Si bipolar transistors and half-micron CMOS FETs. The bipolar transistors are fabricated with self-aligned sidewall polycide base technology (SPOTEC), which makes it possible to reduce their area below that of CMOS FETs. Their footprint can be as small as 9.4 μm2. Shallow junction technologies improve bipolar performance, and a maximum cut-off frequency of 38 GHz is achieved with good bipolar and CMOS I-V characteristics. The driving ability of these BiCMOS circuits is twice as that of CMOS circuits
  • Keywords
    BiCMOS integrated circuits; 38 GHz; BiCMOS circuits; I-V characteristics; SPOTEC; Si bipolar transistors; Si-SiO2; Si-WSix; elemental semiconductor; half-micron CMOS FETs; maximum cut-off frequency; self-aligned sidewall polycide base technology; small high-speed; very-high-speed ULSIs; BiCMOS integrated circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCOMS Circuits and Technology Meeting, 1993., Proceedings of the 1993
  • Conference_Location
    Minneapolis, MN
  • Print_ISBN
    0-7803-1316-X
  • Type

    conf

  • DOI
    10.1109/BIPOL.1993.617471
  • Filename
    617471