DocumentCode :
1624150
Title :
High Current AC Break Arc Contact Erosion
Author :
Shea, John
Author_Institution :
Eaton Corp., Pittsburgh, PA
fYear :
2008
Abstract :
Contact break arc erosion fundamentals applicable to high power switching devices in air (e.g. air- magnetic circuit breakers and contactors) are reviewed along with recent results showing dominant factors that affect contact erosion in the range of 3 kAp to 22 kAp. Background covers a review of arc plasma theory pertaining to contact erosion in air at atmospheric pressure including metallic bridge formation, metallic-to-gaseous arc phase transition, plasma sheath formation, anode and cathode erosion, contact area effects, material composition, manufacturing methods, and metal vapor jet formation. One of the significant results from this data was that current density increased and erosion dramatically increased as the arc root area approached the contact surface area dimensions. Transient values for power density, current density, and arc conductivity were also measured using synchronized waveform acquisition with high-speed video to provide useful data in a current range where there is little published data available. High-current molten metal bridge results are also presented from the corresponding erosion test data that illustrate the many different types of bridge formation and voltage waveshapes at contact part. The theory and the experimental data presented will be useful for those who model contact erosion or need to understand the critical factors and the degree to which these factors can affect contact erosion.
Keywords :
arcs (electric); atmospheric temperature; current density; electrical contacts; anode erosion; arc plasma theory; atmospheric pressure; cathode erosion; contact area effect; contact break arc erosion; contact surface; current density; high current AC; metal vapor jet formation; metallic bridge formation; metallic-to-gaseous arc phase transition; plasma sheath formation; synchronized waveform acquisition; Atmospheric-pressure plasmas; Bridge circuits; Contactors; Current density; Magnetic circuits; Magnetic switching; Plasma density; Plasma devices; Plasma sheaths; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2008. Proceedings of the 54th IEEE Holm Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1901-2
Electronic_ISBN :
978-1-4244-1902-9
Type :
conf
DOI :
10.1109/HOLM.2008.ECP.13
Filename :
4694914
Link To Document :
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