DocumentCode
1624305
Title
Shot Noise of High Current Electron Field Emission
Author
Ang, L.K. ; Wu, L.
Author_Institution
Nanyang Technol. Univ., Singapore
fYear
2007
Firstpage
580
Lastpage
580
Abstract
Summary form only given. This paper presents the importance of space charge effects on the shot noise for electron field emission, in classical, quantum, and relativistic regimes. The Fano factor (which characterizes the reduction of shot noise power from the Schottky shot noise for a thermionic emitter) is computed in each regime. The value of Fano factor is found to be enhanced substantially, when space charge effects are included over a wide range of gap spacing and applied voltage at various work functions. In quantum regime with gap spacing in nanometer scale between cathode and anode, decreasing gap spacing D or work function PhiWF or temperature will reduce the Fano factor, thus more shot noise reduction. In relativistic regime, where an extremely large bias is applied across a large gap, we will have less shot noise reduction due to relativistic effects as compared to the classical regime.
Keywords
electrodes; electron field emission; shot noise; space charge; spin polarised transport; vacuum microelectronics; work function; Fano factor; Schottky shot noise; applied voltage; classical electron field emission; electron field emission shot noise; gap spacing; high current electron field emission; quantum electron field emission; relativistic electron field emission; shot noise power reduction; space charge effects; thermionic emitter; work function; Cathodes; Electron emission; High performance computing; Noise reduction; Power engineering and energy; Power engineering computing; Quantum computing; Space charge; Space technology; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
Conference_Location
Albuquerque, NM
ISSN
0730-9244
Print_ISBN
978-1-4244-0915-0
Type
conf
DOI
10.1109/PPPS.2007.4345886
Filename
4345886
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