• DocumentCode
    1624305
  • Title

    Shot Noise of High Current Electron Field Emission

  • Author

    Ang, L.K. ; Wu, L.

  • Author_Institution
    Nanyang Technol. Univ., Singapore
  • fYear
    2007
  • Firstpage
    580
  • Lastpage
    580
  • Abstract
    Summary form only given. This paper presents the importance of space charge effects on the shot noise for electron field emission, in classical, quantum, and relativistic regimes. The Fano factor (which characterizes the reduction of shot noise power from the Schottky shot noise for a thermionic emitter) is computed in each regime. The value of Fano factor is found to be enhanced substantially, when space charge effects are included over a wide range of gap spacing and applied voltage at various work functions. In quantum regime with gap spacing in nanometer scale between cathode and anode, decreasing gap spacing D or work function PhiWF or temperature will reduce the Fano factor, thus more shot noise reduction. In relativistic regime, where an extremely large bias is applied across a large gap, we will have less shot noise reduction due to relativistic effects as compared to the classical regime.
  • Keywords
    electrodes; electron field emission; shot noise; space charge; spin polarised transport; vacuum microelectronics; work function; Fano factor; Schottky shot noise; applied voltage; classical electron field emission; electron field emission shot noise; gap spacing; high current electron field emission; quantum electron field emission; relativistic electron field emission; shot noise power reduction; space charge effects; thermionic emitter; work function; Cathodes; Electron emission; High performance computing; Noise reduction; Power engineering and energy; Power engineering computing; Quantum computing; Space charge; Space technology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
  • Conference_Location
    Albuquerque, NM
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-0915-0
  • Type

    conf

  • DOI
    10.1109/PPPS.2007.4345886
  • Filename
    4345886