• DocumentCode
    162447
  • Title

    Discussions on the semiconductor-based galvanic isolation

  • Author

    Xuan Zhang ; Lixing Fu ; Mingzhi Leng ; Jin Wang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
  • fYear
    2014
  • fDate
    13-15 Oct. 2014
  • Firstpage
    75
  • Lastpage
    80
  • Abstract
    This paper presents the discussions on a semiconductor-based solution for galvanic isolation. It is a switched-capacitor (SC) isolated dc/dc converter based on the SC isolation cell structure, which aims to utilize the semiconductor switches to sustain isolation voltage and block common-mode (CM) leakage current. The converter delivers an active power with ZCS operation. The circuit structure and operation principle are introduced. To achieve high efficiency, the converter requires high voltage rating, low output capacitance, and low on-resistance of the switches, which makes the SiC devices the best choice, as shown in a comparison between the state-of-the-art Si and SiC devices. To validate the galvanic isolation, the isolation voltage and touch current (TC) must be evaluated according to the industrial safety standards such as IEC60950-1. Series connection of the SC isolation cells contributes to higher isolation voltage of the. It is also expected to provide smaller equivalent series capacitance which has higher impedance to block the line-frequency CM leakage current. However, study shows that the charging transients of the switch output capacitance results in a CM leakage current. This issue is verified by the test results from a prototype made of 2 SC isolation cells in series. This CM leakage current remains as a challenge for this isolation solution.
  • Keywords
    DC-DC power convertors; capacitance; capacitors; electric resistance; elemental semiconductors; leakage currents; semiconductor switches; silicon; silicon compounds; transient analysis; wide band gap semiconductors; zero current switching; CM leakage current; IEC60950-1; SC isolation cell structure; Si; SiC; TC; ZCS operation; charging transients; circuit structure; common-mode leakage current; equivalent series capacitance; high voltage rating; industrial safety standards; line-frequency CM leakage current; low on-resistance; low output capacitance; semiconductor switches; semiconductor-based galvanic isolation; switched-capacitor isolated dc-dc converter; touch current; Decision support systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wide Bandgap Power Devices and Applications (WiPDA), 2014 IEEE Workshop on
  • Conference_Location
    Knoxville, TN
  • Type

    conf

  • DOI
    10.1109/WiPDA.2014.6964628
  • Filename
    6964628