Title :
Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection
Author :
Yang, Wen-Ren ; Yang, Wen-Xun
Author_Institution :
Dept. of Electr. Eng., Changhua Univ. of Educ., Changhua, Taiwan
Abstract :
This paper presents discrete wavelet transform (DWT) and short-time fourier transform (STFT) applications for different industrial applications. These two transforms have been compared in different fields, and their implementations are similar. The experiments and simulations show another aspect for both transforms in order to analyze the target information.
Keywords :
Fourier transforms; crack detection; discrete wavelet transforms; microcracks; power supply quality; semiconductor device manufacture; discrete wavelet transform; short time Fourier transform; voltage sag detection; wafer microcrack; Paints; Transforms; Discrete wavelet transform; microcrack; power quality; short-time fourier transform;
Conference_Titel :
System Science and Engineering (ICSSE), 2010 International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-6472-2
DOI :
10.1109/ICSSE.2010.5551794
