DocumentCode
1624683
Title
Discrete wavelet transform and short-time fourier transform applications: Wafer microcrack and voltage sag detection
Author
Yang, Wen-Ren ; Yang, Wen-Xun
Author_Institution
Dept. of Electr. Eng., Changhua Univ. of Educ., Changhua, Taiwan
fYear
2010
Firstpage
31
Lastpage
35
Abstract
This paper presents discrete wavelet transform (DWT) and short-time fourier transform (STFT) applications for different industrial applications. These two transforms have been compared in different fields, and their implementations are similar. The experiments and simulations show another aspect for both transforms in order to analyze the target information.
Keywords
Fourier transforms; crack detection; discrete wavelet transforms; microcracks; power supply quality; semiconductor device manufacture; discrete wavelet transform; short time Fourier transform; voltage sag detection; wafer microcrack; Paints; Transforms; Discrete wavelet transform; microcrack; power quality; short-time fourier transform;
fLanguage
English
Publisher
ieee
Conference_Titel
System Science and Engineering (ICSSE), 2010 International Conference on
Conference_Location
Taipei
Print_ISBN
978-1-4244-6472-2
Type
conf
DOI
10.1109/ICSSE.2010.5551794
Filename
5551794
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