• DocumentCode
    1624877
  • Title

    A Multi-Physics Finite Element Model of an Electrical Connector Considering Rough Surface Contact

  • Author

    Angadi, Santosh V. ; Wilson, W. Everett ; Jackson, Robert L. ; Flowers, George T. ; Rickett, Bretton I.

  • Author_Institution
    Dept. of Mech. Eng., Auburn Univ., Auburn, AL
  • fYear
    2008
  • Firstpage
    168
  • Lastpage
    177
  • Abstract
    Any engineering component possesses roughness on its surface when it is observed microscopically, including electrical connectors. Electrical connectors usually consist of a spring and a pin. In this study, the spring part is in the shape of a compliant curved beam whereas the pin one is of a flat form and these two parts are in contact during operation. This work presents a multi-physics (structural, electrical and thermal) finite element model of the bulk region of an electrical connector. The rough surfaces of the spring and pin parts are considered using a multi-scale sinusoidal rough surface (MSRS) contact model. The resulting coupled multi-physics connector model is used to analyze the performance of the connector while the applied current is incremented from 5 to 20 A. As expected, this produced a proportional rise in voltage drop and temperature across the bulk regions of the connector parts. The coupled multi-physics model together with the MSRS model should provide greater accuracy in the prediction of contact forces, electrical contact resistance (ECR) and thermal contact resistance (TCR). The present work also provides valuable information on stresses and strains distributions, current flow and temperature variations in the bulk regions of the electrical connector.
  • Keywords
    contact resistance; electric connectors; finite element analysis; rough surfaces; stress-strain relations; thermal resistance; current 5 A to 20 A; electrical connector; electrical contact resistance; multiphysics finite element model; multiscale sinusoidal rough surface; rough surface contact; strain distribution; stress distribution; thermal contact resistance; voltage drop; Connectors; Contact resistance; Finite element methods; Microscopy; Predictive models; Rough surfaces; Shape; Springs; Surface roughness; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2008. Proceedings of the 54th IEEE Holm Conference on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4244-1901-2
  • Electronic_ISBN
    978-1-4244-1902-9
  • Type

    conf

  • DOI
    10.1109/HOLM.2008.ECP.40
  • Filename
    4694941