DocumentCode :
1624975
Title :
Electrical Contact Resistance Considering Multi-Scale Roughness
Author :
Wilson, W. Everett ; Angadi, Santosh V. ; Jackson, Robert L.
Author_Institution :
Dept. of Mech. Eng., Auburn Univ., Auburn, AL
fYear :
2008
Firstpage :
190
Lastpage :
197
Abstract :
Surface roughness has many effects in contacting engineering surfaces and electrical connectors are no exception. In connectors, the roughness on the surfaces causes added electrical resistance (known as electrical contact resistance (ECR)). This work presents a new method for modeling ECR while considering the multi-scale nature of surfaces in the contact mechanics and electrical resistivity theory. Based on Archard\´s "protuberance upon protuberance" theory, this method employs sinusoids stacked into layers to represent the rough surface. However, many models already exist ranging from statistical to other forms of multi-scale methods. There is considerable debate in the field of contact mechanics as to which method is the "best". Since all methods have various advantages and disadvantages, this work makes a comparison between several different models. In particular, results from the sinusoidal multi-scale model are evaluated alongside results from statistical methods for both perfectly elastic and elastic-plastic deformation. This effort has shown qualitative similarities despite quantitative discrepancies.
Keywords :
contact resistance; electrical resistivity; rough surfaces; elastic-plastic deformation; electrical contact resistance; electrical resistance; electrical resistivity theory; multiscale model; multiscale roughness; protuberance upon protuberance theory; rough surface; statistical methods; surface roughness; Connectors; Contact resistance; Electric resistance; Fractals; Frequency; Mathematical model; Mathematics; Rough surfaces; Surface resistance; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2008. Proceedings of the 54th IEEE Holm Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1901-2
Electronic_ISBN :
978-1-4244-1902-9
Type :
conf
DOI :
10.1109/HOLM.2008.ECP.43
Filename :
4694944
Link To Document :
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