Title :
Complete visual metrology using relative affine structure
Author :
Miglani, Adersh ; Roy, Sanjay Dhar ; Chaudhury, Santanu ; Srivastava, J.B.
Abstract :
We propose a framework for retrieving metric information for repeated objects from single perspective image. Relative affine structure, which is an invariant, is directly proportional to the Euclidean distance of a three dimensional point from a reference plane. The proposed method is based on this fundamental concept. The first object undergoes 4 × 4 transformation and results in a repeated object. We represent this transformation in terms of three relative affine structures along X, Y and Z axes. Additionally, we propose the possible extension of this framework for motion analysis - structure from motion and motion segmentation.
Keywords :
computer vision; image motion analysis; image retrieval; image segmentation; Euclidean distance; complete visual metrology; metric information retrieval; motion analysis; motion segmentation; perspective image; relative affine structure; repeated object; structure from motion; Cameras; Computer vision; Geometry; Measurement; Metrology; Three-dimensional displays; Visualization;
Conference_Titel :
Computer Vision, Pattern Recognition, Image Processing and Graphics (NCVPRIPG), 2013 Fourth National Conference on
Conference_Location :
Jodhpur
Print_ISBN :
978-1-4799-1586-6
DOI :
10.1109/NCVPRIPG.2013.6776265