• DocumentCode
    1625089
  • Title

    Comparison of dispatching rules for semiconductor manufacturing using large facility models

  • Author

    Mittler, Manfred ; Schoemig, Alexander K.

  • Author_Institution
    IBM, Stuttgart, Germany
  • Volume
    1
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    709
  • Abstract
    We present a comparison of five dispatching rules that aim to reduce the mean and the variance of cycle times. The performance of the dispatch rules is evaluated using simulation results for two large semiconductor wafer fabrication facilities. The results show that which dispatch rule achieves the best results depends on the fab, on the load of the fab and on the product
  • Keywords
    dispatching; production control; semiconductor device manufacture; stock control; Delphi simulation tool; cycle times; dispatching rules; fab; fabrication facility; inventory control; large facility models; mean; semiconductor manufacturing; semiconductor wafer fabrication; supply chain management; variance; Dispatching; Electric breakdown; Fabrication; Manufacturing processes; Production facilities; Raw materials; Road transportation; Semiconductor device manufacture; Time measurement; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference Proceedings, 1999 Winter
  • Conference_Location
    Phoenix, AZ
  • Print_ISBN
    0-7803-5780-9
  • Type

    conf

  • DOI
    10.1109/WSC.1999.823197
  • Filename
    823197