Title :
RF and stability performance of Double Gate Tunnel FET
Author :
Sivasankaran, K. ; Mallick, P.S. ; Murali, N. ; Kumar, Kush
Author_Institution :
Sch. of Electr. Eng., VIT Univ., Vellore, India
Abstract :
This paper presents radio frequency (RF) performance and high frequency stability of Double Gate Tunnel FET (DG TFET). A non-quasi static small signal model is used to extract small signal parameters which are then verified with extracted parameters through simulation. The high frequency performance of DG TFET is evaluated by extracting RF parameters like cut-off frequency (ft), maximum oscillation frequency (fmax) and stability factor (K). The result shows that DG TFET has cut-off frequency of 350GHz and unconditionally stable from 11GHz onwards.
Keywords :
field effect transistors; semiconductor device models; stability; RF performance; cut-off frequency; double gate tunnel FET; frequency 350 GHz; high frequency stability; maximum oscillation frequency; nonquasistatic small signal model; stability factor; Artificial intelligence; Cutoff frequency; Field effect transistors; Logic gates; Noise; Radio frequency; Radio Frequency; Small-signal model; Stability Factor; TCAD Simulation; Tunnel FET;
Conference_Titel :
Emerging Electronics (ICEE), 2012 International Conference on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4673-3135-7
DOI :
10.1109/ICEmElec.2012.6636278