Title :
MMIC characterization using electro-optic field mapping
Author :
Jäger, D. ; David, G.
Author_Institution :
FG Optoelektronik, Gerhard-Mercator-Univ. Duisburg, Germany
Abstract :
It has been demonstrated previously that the technique of direct electro-optic probing can successfully be applied to study two-dimensional electric field distributions in MMICs. As a result, each MMIC component can be characterized by on-wafer and in-circuit measurements up to millimeter wave frequencies. In this paper, experimental results performed on a traveling-wave amplifier are presented as an example. Different MMIC components (interdigitated capacitor and MESFET) are tested in detail and a quantitative comparison with theoretical results is carried out. Coplanar waveguide modes are also studied in detail
Keywords :
MESFET integrated circuits; MMIC amplifiers; coplanar waveguides; electric field measurement; field effect MMIC; integrated circuit testing; microwave measurement; millimetre wave measurement; travelling wave amplifiers; 1 to 12 GHz; MESFET; MMIC characterization; MMIC components; electro-optic field mapping; in-circuit measurements; interdigitated capacitor; on-wafer measurements; traveling-wave amplifier; two-dimensional electric field distributions; Capacitors; Circuit testing; Frequency measurement; MESFETs; MMICs; Millimeter wave measurements; Optical amplifiers; Semiconductor optical amplifiers; Spatial resolution; Transmission line theory;
Conference_Titel :
Signals, Systems, and Electronics, 1995. ISSSE '95, Proceedings., 1995 URSI International Symposium on
Conference_Location :
San Francisco
Print_ISBN :
0-7803-2516-8
DOI :
10.1109/ISSSE.1995.497930
