DocumentCode :
1625204
Title :
Wafer scale architecture for an FFT processor
Author :
Jain, V.K. ; Nienhaus, H.A. ; Landis, D.L. ; Al-Arian, A. ; Alvarez, C.E.
Author_Institution :
Coll. of Eng., Univ. of South Florida, Tampa, FL, USA
fYear :
1989
Firstpage :
453
Abstract :
A description is given of research on a WSI FFT processor. Attention is focused on the design methodology, architecture, and sparing strategy and restructuring. The basic cells utilized are the MSA and the coefficient ROM. The wafer thus has only two types of cell, making the algorithm highly suitable for restructable wafer-scale integration (WSI) design. The restructuring algorithm is discussed briefly, and the tradeoffs between cell redundancy, wafer-area utilization, and effective yield are evaluated. Indeed, interest in WSI arises from expectations of higher speed, better reliability, and significant improvement in the circuit density. This FFT wafer represents the first of several envisioned in large-scale signal processing and computing under a DARPA microelectronics project in progress
Keywords :
VLSI; digital signal processing chips; fast Fourier transforms; microprocessor chips; read-only storage; DARPA microelectronics project; FFT processor; MSA; WSI FFT processor; architecture; cell redundancy; circuit density; coefficient ROM; design methodology; effective yield; large-scale signal processing; reliability; restructable wafer-scale integration; sparing strategy; speed; wafer-area utilization; Adders; Automatic testing; Circuit testing; Equations; Flow graphs; Large-scale systems; Microelectronics; Read only memory; Signal processing algorithms; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1989., IEEE International Symposium on
Conference_Location :
Portland, OR
Type :
conf
DOI :
10.1109/ISCAS.1989.100388
Filename :
100388
Link To Document :
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