DocumentCode :
1625337
Title :
Degradation Phenomenon of Electrical Contacts by 3-D Oscillating Mechanism:3-D Oscillating Mechanism for Trial
Author :
Wada, Shin-ichi ; Sawa, Koichiro
Author_Institution :
R&D Dept., TMC Syst. Co., Ltd., Kawasaki
fYear :
2008
Firstpage :
284
Lastpage :
293
Abstract :
The authors have developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertical direction and also a sliding contact mechanism by a magnetostrictive actuator. By using both mechanisms, the influences of a micro-oscillating on contact resistance are examined. Further, 3D oscillation mechanism has been designed to simulate real vibrations that expanded 1D oscillation mechanism (that is to say hammering oscillation mechanism and sliding contact mechanism) into 3D. And the fundamental characteristics of the mechanism are obtained, such as acceleration and displacement at various frequencies, output wave forms to sinusoidal inputs, and mechanical interferences in the X, Y, and Z-directions of the stage. Experimental results suggested that the mechanism could detect more real degradation phenomenon on contacts by the influences of micro-vibration. However, it is necessary that the mechanism should be improved, for instance, in precision mechanism and in feedback control.
Keywords :
actuators; contact resistance; electrical contacts; electromagnetic oscillations; interference; magnetostrictive devices; vibrations; contact resistance; degradation phenomenon; electrical contact; hammering oscillation; magnetostrictive actuator; mechanical interference; microoscillation; microvibration; oscillating mechanism; sinusoidal input; sliding contact; Acceleration; Actuators; Computational modeling; Connectors; Contact resistance; Degradation; Frequency; Magnetic materials; Magnetostriction; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2008. Proceedings of the 54th IEEE Holm Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1901-2
Electronic_ISBN :
978-1-4244-1902-9
Type :
conf
DOI :
10.1109/HOLM.2008.ECP.57
Filename :
4694958
Link To Document :
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