Title :
Arc Affected Surface Composition Changes in Silver Tin Oxide Contacts
Author :
Streicher, Eric ; Leung, Chi ; Fitzgerald, Dennis
Author_Institution :
AMI DODUCO, Export, PA
Abstract :
The mandate to replace silver-cadmium oxide (Ag/CdO), which has been a preferred material for many contact applications, presents a need for arc erosion data to allow for informed material design decisions. The high cost of indium necessitates a better understanding of the role of indium oxide in the product. This is a follow up of the comparison between Ag/SnO2/In2O3 by IO and PM method, and the work to examine the effect of In2O3 in the PM approach. Reported here are additional work of detailed chemical analysis and x-ray diffraction analysis performed on the arc erosion products to determine the compositional changes.
Keywords :
X-ray diffraction; chemical analysis; electrical contacts; indium compounds; silver compounds; surface composition; tin compounds; Ag-SnO2-In2O3; X-ray diffraction; arc affected surface composition; arc erosion products; chemical analysis; silver tin oxide contacts; silver-cadmium oxide; Additives; Chemical analysis; Composite materials; Contact resistance; Indium; Oxidation; Silver; Surface resistance; Testing; Tin;
Conference_Titel :
Electrical Contacts, 2008. Proceedings of the 54th IEEE Holm Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-1901-2
Electronic_ISBN :
978-1-4244-1902-9
DOI :
10.1109/HOLM.2008.ECP.59
