Title :
Measurement of nonreciprocal stimulated Raman scattering in silicon photonic wires
Author :
Krause, Michael ; Müller, Jost ; Brinkmeyer, Ernst
Author_Institution :
E-11 Optische Kommunikationstechnik, Tech. Univ. Hamburg-Harburg, Hamburg, Germany
Abstract :
Nonreciprocal stimulated Raman scattering in a silicon waveguide is shown experimentally for the first time: the measured backward-to-forward transmission ratio is enhanced when a probe laser is tuned to the Stokes wavelength.
Keywords :
elemental semiconductors; light transmission; measurement by laser beam; optical waveguides; silicon; stimulated Raman scattering; Si; Stokes wavelength; backward-to-forward transmission ratio; nonreciprocal stimulated Raman scattering; probe laser; silicon photonic wires; silicon waveguide; Gratings; Optical waveguides; Photonics; Probes; Raman scattering; Silicon; Wavelength measurement;
Conference_Titel :
Group IV Photonics (GFP), 2012 IEEE 9th International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4577-0826-8
DOI :
10.1109/GROUP4.2012.6324068
