• DocumentCode
    1625544
  • Title

    Analysis of Contact Resistance Data with Weibull Distribution Function

  • Author

    Hasegawa, Makoto ; Yanagitani, Yuta

  • Author_Institution
    Dept. of Appl. Photonics Syst. Technol., Chitose Inst. of Sci. & Technol., Chitose
  • fYear
    2008
  • Firstpage
    344
  • Lastpage
    349
  • Abstract
    In order to realize detailed analysis of measured contact resistance data, fitting of Weibull distribution function to contact resistance data is being tried. For that purpose, the original Weibull fitting software has been prepared, and applied to some sets of the measured data. When successful fitting results are obtained, an average value of the contact resistance data can be replaced with the sum of two Weibull parameters, i.e., the location parameter Ro and the scale parameter Ra. However, more revisions to the fitting algorithm are still required for realizing further study of contact resistance characteristics through the Weibull fitting analysis.
  • Keywords
    Weibull distribution; contact resistance; Weibull distribution function; Weibull fitting software; contact resistance data; location parameter Ro; scale parameter Ra; Arc discharges; Contact resistance; Electrical resistance measurement; Mechanical variables measurement; Partial discharges; Software measurement; Surface discharges; Surface fitting; Surface resistance; Weibull distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2008. Proceedings of the 54th IEEE Holm Conference on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4244-1901-2
  • Electronic_ISBN
    978-1-4244-1902-9
  • Type

    conf

  • DOI
    10.1109/HOLM.2008.ECP.66
  • Filename
    4694967