Modeling of brownian-bridge-based analysis of the segmental D/A converters yield

Author

Ling, Wenyuan ; Guogang, Chaodong Li

Author_Institution

Coll. of Inf. Sci. & Eng., Huaqiao Univ., Xiamen, China

fYear

2010

Firstpage

88

Lastpage

90

Abstract

According to the stochastic process of Brownian bridge theory, a DAC model of INL and segment ratio is presented based on the INL probability density for segmental current-steering DAC. The approximate formula for influence of chip yield in the current mismatch is obtained and the model is carried out by Monte Carlo simulation method. It is demonstrated that DAC yield is lower compared using thermometer-code to using binary-code in the low-bits. When transform bits N <; 12, the greater binary-code(> [N/2]), the higher yield. Binary-code bits is not suitable for large when N ≥ 12.

Keywords

Monte Carlo methods; digital-analogue conversion; probability; Brownian bridge theory; INL probability density; Monte Carlo simulation method; binary code; segment ratio; segmental D/A converters; segmental current-steering DAC; stochastic process; thermometer code; Binary codes; Bridge circuits; Encoding; Mathematical model; Monte Carlo methods; Motion segmentation; Stochastic processes; Brownian bridge motion; Chip yield; INL; Segmental current steering digital-analog circuit; Stochastic process;

fLanguage

English

Publisher

ieee

Conference_Titel

Anti-Counterfeiting Security and Identification in Communication (ASID), 2010 International Conference on

Conference_Location

Chengdu

Print_ISBN

978-1-4244-6731-0

Type

conf

DOI

10.1109/ICASID.2010.5551829

Filename

5551829