Title :
Modeling of brownian-bridge-based analysis of the segmental D/A converters yield
Author :
Ling, Wenyuan ; Guogang, Chaodong Li
Author_Institution :
Coll. of Inf. Sci. & Eng., Huaqiao Univ., Xiamen, China
Abstract :
According to the stochastic process of Brownian bridge theory, a DAC model of INL and segment ratio is presented based on the INL probability density for segmental current-steering DAC. The approximate formula for influence of chip yield in the current mismatch is obtained and the model is carried out by Monte Carlo simulation method. It is demonstrated that DAC yield is lower compared using thermometer-code to using binary-code in the low-bits. When transform bits N <; 12, the greater binary-code(> [N/2]), the higher yield. Binary-code bits is not suitable for large when N ≥ 12.
Keywords :
Monte Carlo methods; digital-analogue conversion; probability; Brownian bridge theory; INL probability density; Monte Carlo simulation method; binary code; segment ratio; segmental D/A converters; segmental current-steering DAC; stochastic process; thermometer code; Binary codes; Bridge circuits; Encoding; Mathematical model; Monte Carlo methods; Motion segmentation; Stochastic processes; Brownian bridge motion; Chip yield; INL; Segmental current steering digital-analog circuit; Stochastic process;
Conference_Titel :
Anti-Counterfeiting Security and Identification in Communication (ASID), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-6731-0
DOI :
10.1109/ICASID.2010.5551829
