• DocumentCode
    1625693
  • Title

    Spatially resolved measurement of free-carrier absorption in silicon waveguides

  • Author

    Müller, Jost ; Huster, Jens ; Krause, Michael ; Renner, Hagen ; Brinkmeyer, Ernst

  • Author_Institution
    E-11 Optische Kommunikationstechnik, Tech. Univ. Hamburg-Harburg, Hamburg, Germany
  • fYear
    2012
  • Firstpage
    33
  • Lastpage
    35
  • Abstract
    Spatially resolved measurement of free-carrier absorption in silicon nanophotonic waveguides using optical frequency-domain reflectometry is reported. Our measurement technique yields the local attenuation that is added by a strong continous-wave pump laser.
  • Keywords
    elemental semiconductors; measurement by laser beam; nanophotonics; optical pumping; optical waveguides; photoexcitation; reflectometry; silicon; two-photon spectra; Si; continous-wave pump laser; free-carrier absorption; local attenuation; optical frequency-domain reflectometry; silicon nanophotonic waveguides; spatially resolved measurement; Absorption; Attenuation; Attenuation measurement; Nonlinear optics; Optical variables measurement; Optical waveguides; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Group IV Photonics (GFP), 2012 IEEE 9th International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1949-2081
  • Print_ISBN
    978-1-4577-0826-8
  • Type

    conf

  • DOI
    10.1109/GROUP4.2012.6324077
  • Filename
    6324077
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1625693