Title :
Spatially resolved measurement of free-carrier absorption in silicon waveguides
Author :
Müller, Jost ; Huster, Jens ; Krause, Michael ; Renner, Hagen ; Brinkmeyer, Ernst
Author_Institution :
E-11 Optische Kommunikationstechnik, Tech. Univ. Hamburg-Harburg, Hamburg, Germany
Abstract :
Spatially resolved measurement of free-carrier absorption in silicon nanophotonic waveguides using optical frequency-domain reflectometry is reported. Our measurement technique yields the local attenuation that is added by a strong continous-wave pump laser.
Keywords :
elemental semiconductors; measurement by laser beam; nanophotonics; optical pumping; optical waveguides; photoexcitation; reflectometry; silicon; two-photon spectra; Si; continous-wave pump laser; free-carrier absorption; local attenuation; optical frequency-domain reflectometry; silicon nanophotonic waveguides; spatially resolved measurement; Absorption; Attenuation; Attenuation measurement; Nonlinear optics; Optical variables measurement; Optical waveguides; Silicon;
Conference_Titel :
Group IV Photonics (GFP), 2012 IEEE 9th International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4577-0826-8
DOI :
10.1109/GROUP4.2012.6324077
