Title :
Measuring permittivity of the dielectric sheet by two kinds of microwave cavities
Author :
Yao, Lixia ; Ni, Zurong ; Liu, Tongzan ; Xiao, Fen
Author_Institution :
Dept. of Phys., Xiamen Univ., Xiamen, China
Abstract :
The formulas were derived for the calculation of the permittivity of dielectric measured in TE109 mode rectangular cavity and TE011 mode cylindrical cavity. A testing system based on scalar network analyzer was adopted to measure the same sheet dielectric by the two cavities above respectively. The testing software based on LABVIEW was developed. The results showed that the measuring error was less than 3.8% and repeatability error was than 1.1% by perturbation method in rectangular cavity, while those are 0.4% and 0.3%, by using cylindrical cavity. The automatic measurement of permittivity of dielectric sheet can be achieved by perturbation method in cylindrical cavity.
Keywords :
dielectric materials; electronic engineering computing; microcavities; microwave circuits; permittivity measurement; perturbation theory; sheet materials; LABVIEW; TE011 mode cylindrical cavity; TE109 mode rectangular cavity; dielectric sheet permittivity measurement; measurement error; microwave cavities; microwave circuit; scalar network analyzer; sheet dielectric measurement; testing software; testing system; Cavity resonators; Dielectrics; Microwave measurements; Microwave theory and techniques; Permittivity; Permittivity measurement; LABVIEW; Microwave cavity; Permittivity; Perturbation method;
Conference_Titel :
Anti-Counterfeiting Security and Identification in Communication (ASID), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-6731-0
DOI :
10.1109/ICASID.2010.5551830
