Title :
Evaluation of power losses in different CCM mode single-phase boost PFC converters via a simulation tool
Author :
Liu, Jinjun ; Chen, Weiyun ; Zhang, Jindong ; Xu, Dehong ; Lee, Fred C.
Author_Institution :
Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
Evaluating the power loss in power semiconductors is an important step in the process of research, development and design of a power electronics circuit topology. This paper presents a way of doing this via computer simulation. It is based on relatively simple component models and a fast simulation tool, but can quite precisely estimate the loss in power semiconductors, including conduction loss, switching loss and loss caused by diode reverse recovery. Several different continuous-conduction-mode (CCM) single-phase power factor correction (PFC) topologies are studied with this simulation approach. The losses in the semiconductors and subsequently the efficiency of different topologies are evaluated and extensively compared. The simulation results reveal quantitative insight of the power losses in different topologies and also verify that this simulation approach is faster and more cost-effective than numerical calculation or experimental measurement approach.
Keywords :
DC-DC power convertors; circuit simulation; losses; power factor correction; power semiconductor diodes; switching circuits; CCM mode single-phase boost PFC converters; computer simulation; conduction loss; continuous-conduction-mode; development; diode reverse recovery loss; loss estimation; power electronics circuit topology; power losses; power losses evaluation; power semiconductors; research; simulation tool; single-phase power factor correction topologies; switching loss; Circuit simulation; Circuit topology; Computational modeling; Computer simulation; Loss measurement; Power electronics; Power factor correction; Power measurement; Semiconductor diodes; Switching loss;
Conference_Titel :
Industry Applications Conference, 2001. Thirty-Sixth IAS Annual Meeting. Conference Record of the 2001 IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-7114-3
DOI :
10.1109/IAS.2001.955965