Title :
Direct extraction of accurate DC bipolar parameters for the forward active region without using optimization
Author_Institution :
Northern Telecom Electron., Nepean, Ont., Canada
Abstract :
Techniques are presented for directly extracting the DC bipolar SPICE parameters for the forward active region without optimization by consistent use of the model equations. The mathematical basis of the extraction technique is explained in detail, and examples of its application as an interactive software system interfaced to the TECAP parameter extractor are shown. Use of the interactive software system permits the forward DC parameters to be determined in less than 10 min. The fit to measured data obtained is good enough that optimization is not required
Keywords :
bipolar integrated circuits; bipolar transistors; electronic engineering computing; interactive systems; semiconductor device models; DC bipolar parameters; TECAP parameter extractor; extraction technique; forward DC parameters; forward active region; interactive software system; model equations; Data mining; Equations; Integrated circuit modeling; Parameter extraction; Reactive power; SPICE; Software systems; Telecommunications; Temperature; Voltage;
Conference_Titel :
Microelectronic Test Structures, 1991. ICMTS 1991. Proceedings of the 1991 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
0-87942-588-1
DOI :
10.1109/ICMTS.1990.161740
