DocumentCode :
1625810
Title :
Circuit Model Predictions for the Performance of ZR
Author :
Struve, Kenneth W. ; Harjes, H.C.
Author_Institution :
Sandia Nat. Lab., Albuquerque
fYear :
2007
Firstpage :
639
Lastpage :
639
Abstract :
Summary form only given. With the completion of the ZR upgrade of the Z accelerator at the Sandia National Laboratories in the summer of 2007, pulsed-power checkout and initial wire-array experiments will begin. The first experiments will be done at reduced machine voltage to allow characterization of the machine, and debugging of components and diagnostics. Predictions for the performance of the machine with various loads and pulsed- power configurations have been made based on measurements made on the Z20 single-module test facility. The pulsed- power drive from the single-module experiments has been well characterized. However performance of the full system is less certain because it is based on calculated impedances and predicted losses, rather than measurements that are not possible before assembly of the full machine. With these caveats in mind we predict load currents and rise-times for the full machine for both short-pulse and long-pulse wire-array and isentropic compression experiment (ICE) load configurations. These predictions are given for both the low-voltage startup conditions, and full-voltage operation. Also presented are equivalent circuit models for ZR that can be imported into other design codes. All predictions are done with Screamer and Bertha circuit-code models.
Keywords :
Z pinch; equivalent circuits; plasma accelerators; pulsed power supplies; Bertha circuit-code model; Sandia National Laboratories; Screamer circuit-code model; Z accelerator; Z20 single-module test facility; ZR accelerator; equivalent circuit model; full-voltage operation; initial wire-array experiment; isentropic compression experiment; low-voltage startup condition; machine voltage; pulsed-power drive; Adders; Circuits; Debugging; Laboratories; Power measurement; Predictive models; Pulse measurements; Test facilities; Voltage; Zirconium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
Conference_Location :
Albuquerque, NM
ISSN :
0730-9244
Print_ISBN :
978-1-4244-0915-0
Type :
conf
DOI :
10.1109/PPPS.2007.4345945
Filename :
4345945
Link To Document :
بازگشت