Title :
Dynamic logic styles with improved noise-immunity
Author :
Mendoza-Hernández, F. ; Linarea, M. ; Champac, V.H.
Author_Institution :
Dept. of Electron. Eng., Nat. Inst. for Astrophys., Opt. & Electron.-INAOE, Puebla, Mexico
fDate :
6/24/1905 12:00:00 AM
Abstract :
Noise issues are becoming an important concern in digital systems due to the aggressive scaling trends in devices and interconnections. Noise effects in deep submicron CMOS VLSI circuits have an importance comparable to area, delay and power consumption. To address this problem a new noise-tolerant dynamic circuit technique suitable for dynamic logic styles is presented. Simulation results show that the proposed technique improves the ANTE (Balamurugan and Shanbhag, IEEE J. Solid-State Circ., vol. 36, no. 2, pp. 273-280, 2001) by 3.4× and 2.8× over conventional dynamic true single-phase-clock (TSPC) and Domino logic, respectively. The improvement in the ANTE-delay quotient is 2.8× and 2.25× over conventional dynamic logic, 2.0× and 1.7× over twin-transistor technique, 1.7× and 1.04× over Bobba´s technique for CMOS TSPC and Domino AND gates, respectively.
Keywords :
CMOS logic circuits; VLSI; circuit simulation; circuit stability; fault tolerance; integrated circuit design; integrated circuit interconnections; integrated circuit noise; interference suppression; logic design; logic simulation; ANTE-delay quotient; CMOS TSPC technique; CMOS VLSI circuits; Domino AND gates; Domino logic; TSPC; device scaling trends; digital systems noise; dynamic logic styles; dynamic true single-phase-clock; interconnection scaling trends; noise-tolerant dynamic circuit techniques; twin transistor technique; CMOS logic circuits; Circuit noise; Delay effects; Digital systems; Energy consumption; Integrated circuit interconnections; Logic circuits; Logic devices; Power system interconnection; Very large scale integration;
Conference_Titel :
Devices, Circuits and Systems, 2002. Proceedings of the Fourth IEEE International Caracas Conference on
Print_ISBN :
0-7803-7380-4
DOI :
10.1109/ICCDCS.2002.1004019
