DocumentCode :
1625885
Title :
The service life of large aluminum electrolytic capacitors: effects of construction and application
Author :
Stevens, J.L. ; Shaffer, J.S. ; Vandenham, J.T.
Author_Institution :
BCcomponents Inc, Columbia, SC, USA
Volume :
4
fYear :
2001
Firstpage :
2493
Abstract :
Large aluminum electrolytic capacitors are usually selected by considering factors such as cost effectiveness (more ripple current or capacitance per dollar), space effectiveness (less volume per dollar), and performance (more useful life at actual application temperature and voltage). These factors have been addressed in recent years as most major manufacturers have responded with improvements in ripple current ratings, new electrolyte systems, high capacitance foils, and rigorous cost controls. The focus of this paper is some of the constructional and application factors affecting the performance of large electrolytic capacitors. An aluminum electrolytic capacitor must be considered as a complete system since the internal failure mechanisms are multiple and complex in their interactions. It is also shown that the choices made by the circuit designer can be informed and improved by understanding the tradeoffs between different capacitor series, circuit design parameters and equipment design enhancements. This understanding can result in designs that are both reliable and cost-effective.
Keywords :
aluminium; electrolytic capacitors; failure analysis; life testing; power capacitors; reliability; Al; application factors; capacitance; circuit design parameters; constructional factors; cost effectiveness; electrolyte systems; equipment design enhancements; high capacitance foils; internal failure mechanisms; large aluminum electrolytic capacitors; ripple current; service life studies; space effectiveness; Aluminum; Capacitance; Capacitors; Circuits; Control systems; Costs; Failure analysis; Manufacturing; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2001. Thirty-Sixth IAS Annual Meeting. Conference Record of the 2001 IEEE
Conference_Location :
Chicago, IL, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-7114-3
Type :
conf
DOI :
10.1109/IAS.2001.955971
Filename :
955971
Link To Document :
بازگشت