DocumentCode :
1625908
Title :
Method for modeling amplitude and bandwidth dependent distortion in nonlinear RF devices
Author :
Jeckeln, E.G. ; Huei-Yuan Shih ; Martony, E. ; Eron, M.
Author_Institution :
Ericsson Amplifiers Technol. Inc., Hauppauge, NY, USA
Volume :
3
fYear :
2003
Firstpage :
1733
Abstract :
A modeling procedure for identifying amplitude and bandwidth dependent distortion in nonlinear RF devices is presented. The modeling mechanism is based on removing the nonlinearity behavior from the relationship between input-output measurements and applying a linear identification procedure using ARMA models. The model parameter estimation is processed through a non-recursive procedure where an overdetermined set of linear equations is solved analytically employing QR-factorization. Results were carried out for different LDMOS transistor modules at 2.14 GHz. The model fit was in the order of 96%. The method allows the bandwidth dependent distortion to be evaluated under real operating conditions by monitoring pole and zero behavior.
Keywords :
UHF field effect transistors; UHF power amplifiers; autoregressive moving average processes; nonlinear distortion; nonlinear network analysis; parameter estimation; poles and zeros; power MOSFET; semiconductor device models; transfer functions; 2.14 GHz; ARMA models; LDMOS transistor modules; QR-factorization; amplitude dependent distortion; bandwidth dependent distortion; envelope transfer function; input-output measurements; intermodulation products; linear identification procedure; model parameter estimation; modeling procedure; nonlinear RF devices; nonrecursive procedure; overdetermined linear equation set; pole behavior; power amplifier design; real operating condition; zero behavior; Bandwidth; Circuits; Digital modulation; Nonlinear distortion; Phase modulation; Power harmonic filters; RF signals; Radio frequency; Radiofrequency amplifiers; Radiofrequency identification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-7695-1
Type :
conf
DOI :
10.1109/MWSYM.2003.1210474
Filename :
1210474
Link To Document :
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