• DocumentCode
    1625950
  • Title

    Cathode Materials Characteristics of CsI Coated Carbon Fiber

  • Author

    Shiffler, Don ; Heidger, Susan ; Cartwright, Keith ; Vaia, Rich ; Liptak, David ; Lacour, Matthew ; Golby, Ken

  • Author_Institution
    Air Force Res. Lab., Aberdeen
  • fYear
    2007
  • Firstpage
    644
  • Lastpage
    644
  • Abstract
    Summary form only given. Csl coated carbon fiber cathodes have shown promise as a cold cathode for microwave and x-ray devices. In particular, the cathodes have demonstrated over 1 million shots lifetime at operating voltages at or in excess of 165 kV and current densities greater than 50 A/cm2. Further, the materials have also operated in a DC mode. While the vacuum emission characteristics have been well-studied1, the materials characteristics of the cathodes themselves, particularly after operation have not received great attention. Furthermore, while researchers at University of Wisconsin" have demonstrated a reduction in work function due to the Csl coating, the emission mechanism remains poorly understood. This paper gives results of a series of materials diagnostics investigating the cathode surface morphology as well as the changes in the carbon fiber structure with cathode shot history. We rely principally upon SEM images and Raman microscopy for this data. Finally, we present a basic model for electron emission from Csl coated carbon fibers that begins to satisfy some of the experimental results.
  • Keywords
    Raman spectra; caesium compounds; carbon fibres; cathodes; electron emission; scanning electron microscopy; surface morphology; C; CsI; CsI-C; Csl coated carbon fiber; Raman microscopy; SEM; carbon fiber structure; cathode materials; cathode surface morphology; cold cathode; electron emission; vacuum emission; Carbon dioxide; Cathodes; Coatings; Current density; Microwave devices; Optical fiber devices; Organic materials; Scanning electron microscopy; Surface morphology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
  • Conference_Location
    Albuquerque, NM
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-0915-0
  • Type

    conf

  • DOI
    10.1109/PPPS.2007.4345950
  • Filename
    4345950