Title :
Implications of area-array I/O for row-based placement methodology
Author :
Caldwell, A.E. ; Kahng, A.B. ; Mantik, S. ; Markov, I.L.
Author_Institution :
Dept. of Comput. Sci., California Univ., Los Angeles, CA, USA
Abstract :
We empirically study the implications of area-array I/O for placement methodology. Our work develops a three-axis testbed that examines (1) I/O pad regime (area-array vs. peripheral pad locations), (2) I/O and core placement methodology (variants of alternating vs. simultaneous I/O and core placement approaches), and (3) placement engine (hierarchical quadratic for both core and I/O cells vs. pure min-cut for core cells and assignment for I/O). Experimental data show that the area-array I/O regime is rather more forgiving of bad placement methodologies than the peripheral I/O regime. On the other hand, the wrong methodology can still entail substantial losses in solution quality and efficiency
Keywords :
integrated circuit layout; integrated circuit packaging; integrated circuit testing; I/O assignment; I/O cells; I/O pad regime; alternating I/O-core placement; area-array I/O; area-array pad locations; core cells; core placement methodology; efficiency; hierarchical quadratic placement engine; min-cut placement engine; peripheral pad locations; placement engine; placement methodology; quality; row-based placement methodology; simultaneous I/O-core placement; three-axis testbed; Clocks; Computer science; Costs; Coupling circuits; Engines; Integrated circuit noise; Integrated circuit packaging; Noise reduction; Routing; Testing;
Conference_Titel :
IC/Package Design Integration, 1998. Proceedings. 1998 IEEE Symposium on
Conference_Location :
Santa Cruz, CA
Print_ISBN :
0-8186-8433-X
DOI :
10.1109/IPDI.1998.663636