• DocumentCode
    1626378
  • Title

    Development of the facial feature extraction and emotion recognition method based on ASM and Bayesian network

  • Author

    Ko, Kwang-Eun ; Sim, Kwee-Bo

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Chung-Ang Univ., Seoul, South Korea
  • fYear
    2009
  • Firstpage
    2063
  • Lastpage
    2066
  • Abstract
    In the facial image, emotions are most widely represented with eye and mouth expressions. If we want to recognize the human´s emotion via the facial image, we need to extract features of the facial image. Active Shape Model (ASM) is one of the most popular methods for facial feature extraction. Regarding the traditional ASM depends on the setting of the initial parameters of the model, in this paper we propose a facial emotion recognizing method based on ASM and Bayesian Network. Firstly, we obtain the reconstructive parameters of the new gray-scale image by sample-based learning and use them to reconstruct the shape of the new image and calculate the initial parameters of the ASM by the reconstructed facial shape. Then reduce the distance error between the model and the target contour by adjusting the parameters of the model. Finally get the model which is matched with the facial feature outline after several iterations and use them to recognize the facial emotion by using Bayesian Network.
  • Keywords
    belief networks; emotion recognition; face recognition; feature extraction; image reconstruction; image sampling; learning (artificial intelligence); shape recognition; ASM; Bayesian network; active shape model; emotion recognition; facial feature extraction; facial feature outline matching; gray-scale image parameter reconstruction; sample-based learning; Active shape model; Bayesian methods; Emotion recognition; Face recognition; Facial features; Feature extraction; Gray-scale; Image recognition; Image reconstruction; Mouth;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fuzzy Systems, 2009. FUZZ-IEEE 2009. IEEE International Conference on
  • Conference_Location
    Jeju Island
  • ISSN
    1098-7584
  • Print_ISBN
    978-1-4244-3596-8
  • Electronic_ISBN
    1098-7584
  • Type

    conf

  • DOI
    10.1109/FUZZY.2009.5277231
  • Filename
    5277231