• DocumentCode
    1626383
  • Title

    An optimal multiline TRL calibration algorithm

  • Author

    Williams, D.F. ; Wang, C.M. ; Arz, U.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    3
  • fYear
    2003
  • Firstpage
    1819
  • Abstract
    We examine the performance of two on-wafer multiline Thru-Reflect-Line (TRL) calibration algorithms: the popular multiline TRL algorithm implemented in the MultiCal/spl reg/ software package, and a newly implemented iterative algorithm designed to give optimal results in the presence of measurement noise. We show that the iterative algorithm outperforms the MultiCal software in the presence of measurement noise, and verify its uncertainty estimates.
  • Keywords
    calibration; iterative methods; measurement uncertainty; microwave measurement; MultiCal; iterative algorithm; measurement noise; multiline TRL calibration algorithm; on-wafer multiline thru-reflect-line; uncertainty estimates; Algorithm design and analysis; Calibration; Iterative algorithms; Iterative methods; Noise measurement; Probes; Scattering parameters; Software algorithms; Software packages; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2003 IEEE MTT-S International
  • Conference_Location
    Philadelphia, PA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7695-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2003.1210494
  • Filename
    1210494
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1626383