Title :
An optimal multiline TRL calibration algorithm
Author :
Williams, D.F. ; Wang, C.M. ; Arz, U.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We examine the performance of two on-wafer multiline Thru-Reflect-Line (TRL) calibration algorithms: the popular multiline TRL algorithm implemented in the MultiCal/spl reg/ software package, and a newly implemented iterative algorithm designed to give optimal results in the presence of measurement noise. We show that the iterative algorithm outperforms the MultiCal software in the presence of measurement noise, and verify its uncertainty estimates.
Keywords :
calibration; iterative methods; measurement uncertainty; microwave measurement; MultiCal; iterative algorithm; measurement noise; multiline TRL calibration algorithm; on-wafer multiline thru-reflect-line; uncertainty estimates; Algorithm design and analysis; Calibration; Iterative algorithms; Iterative methods; Noise measurement; Probes; Scattering parameters; Software algorithms; Software packages; Transmission line matrix methods;
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-7695-1
DOI :
10.1109/MWSYM.2003.1210494
