DocumentCode :
1626860
Title :
Survival of VLSI design - coping with device variability and uncertainty
Author :
Nowka, Kevin
Author_Institution :
VLSI Systems, IBM Austin Research Laboratory, Austria
fYear :
2008
Firstpage :
1
Lastpage :
6
Abstract :
◆ Trends/Challenges ■ Variability increasing as Design/Manufacturing interface complexity rising. ◆ More design rules, more 2nd order effects, more systematic variations, more correction steps... ■ Current techniques are insufficient ◆ Abstractions no longer good enough ◆ Predictability is poor ■ Ability to confidently bound performance is degrading. ■ Frequent model/hardware mismatch. ◆ Required Action ■ Better, targeted measurements through characterization structures ■ Hardware-driven variation-enabled modeling ◆ Corners not sufficient any more - statistical timing ■ Technology aware circuit and PD tools ◆ Variation tolerance in design ◆ Technology aware physical design, redundancy, adaptation.
Keywords :
Circuits; Current measurement; Degradation; Hardware; Predictive models; Redundancy; Timing; Uncertainty; Very large scale integration; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems Workshop: System-on-Chip - Design, Applications, Integration, and Software, 2008 IEEE Dallas
Conference_Location :
Richardson, TX, USA
Print_ISBN :
978-1-4244-2955-4
Electronic_ISBN :
978-1-4244-2956-1
Type :
conf
DOI :
10.1109/DCAS.2008.4695909
Filename :
4695909
Link To Document :
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