DocumentCode
1626983
Title
Room temperature operation and DC characteristics of InAlN/GaN/AlGaN Hot Electron Transistors with common base transfer ratio, α = 0.97
Author
Dasgupta, Sansaptak ; Nidhi ; Raman, A. ; Speck, J.S. ; Mishra, Umesh K.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, CA, USA
fYear
2010
Firstpage
133
Lastpage
134
Abstract
To summarize a novel nitride based HET with InAIN as the emitter layer is demonstrated. These devices show an excellent common base transfer ratio of 0.96 0.97 and operation in the CE configuration. Nitride based HETs due to the thin base transit region, and high electron injection velocity could offer advantages as high speed RF devices.
Keywords
III-V semiconductors; aluminium compounds; gallium compounds; hole mobility; hot electron transistors; indium compounds; ohmic contacts; DC characteristics; InAlN-GaN-AlGaN; high electron injection velocity; hot electron transistors; room temperature operation; Gallium nitride; Optical wavelength conversion;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2010
Conference_Location
South Bend, IN
ISSN
1548-3770
Print_ISBN
978-1-4244-6562-0
Electronic_ISBN
1548-3770
Type
conf
DOI
10.1109/DRC.2010.5551877
Filename
5551877
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